Patent · US Expired

Method and apparatus for reducing ESD during thermal shock testing

US5646813A · kind A · utility

3Cited by
5References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 3, 1995
Grant dateJul 8, 1997
Priority date
Expiry dateMar 3, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K9/0067
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Electrostatic discharge during thermal shock testing on an electronic device (12) by alternate immersion in hot and cold baths (14, 16) of a fully-fluorinated liquid (20) can be reduced by carrying the device within a first, electrically conductive, open-weave basket (32) enclosed within, and coupled to a second basket (30) of similar construction, but a looser weave. The first basket acts as a Faraday shield about the electronic device when both baskets are alternately immersed in the hot and cold baths.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.