Patent · US Expired

Proof test for ceramic parts

US5647667A · kind A · utility

7Cited by
11References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 1995
Grant dateJul 15, 1997
Priority date
Expiry dateJun 6, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/388
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

For testing structural ceramic parts under overload conditions, a previously calculated temperature distribution is generated on the part by thermal radiation, this temperature distribution inducing the desired test stress or overload. The temperature distribution is measured with topically and temporally resolving temperature sensors, is compared to a desired or calculated temperature distribution, and is regulated by varying the duration and/or location of the radiation influence until the desired temperature distribution has been produced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.