Proof test for ceramic parts
US5647667A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 1995 |
| Grant date | Jul 15, 1997 |
| Priority date | — |
| Expiry date | Jun 6, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/388
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
For testing structural ceramic parts under overload conditions, a previously calculated temperature distribution is generated on the part by thermal radiation, this temperature distribution inducing the desired test stress or overload. The temperature distribution is measured with topically and temporally resolving temperature sensors, is compared to a desired or calculated temperature distribution, and is regulated by varying the duration and/or location of the radiation influence until the desired temperature distribution has been produced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.