Large integrated circuit with modular probe structures
US5648730A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 30, 1994 |
| Grant date | Jul 15, 1997 |
| Priority date | — |
| Expiry date | Nov 30, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2733
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A large integrated circuit (10) of modular design, each module (12,14,16) having a circuit section (22,24,34) and a separate dedicated testing pad section (20). Each circuit module (12,14,16) can be individually functionally tested as an independent circuit with conventional prober equipment for defects. Each testing pad section (20) facilitates controlling the entire integrated circuit (10) so that the respective module circuit section (12,14,16) can be tested. Control circuitry (26) comprised of pass gates is provided to isolate the testing pad sections (20) from the operational portion (22,24,34) of the integrated circuit (10) when not under test. The present invention is ideally suited for large spatial light modulators, memory devices and other large sophisticated integrated circuits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.