Method and device for verifying that a given insulative element conforms to a reference insulative element
US5650620A · kind A · utility
2Cited by
2References
8Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Mar 28, 1996 |
| Grant date | Jul 22, 1997 |
| Priority date | — |
| Expiry date | Mar 28, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/2251
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of verifying that a given insulative element conforms with a reference insulative element, comprising the steps of: emitting a primary beam of electrons impinging on the given insulative element, receiving a secondary beam of electrons returned by the given insulative element in response to emission of the primary beam of electrons, and comparing a curve as a function of time of the electrical current of the secondary beam received with a curve as a function of time of a reference electrical current to establish whether or not the given insulative element conforms to a reference insulative element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.