Automatic measurement of cleaning brush nip width for process control and/or diagnostics
US5652945A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 1996 |
| Grant date | Jul 29, 1997 |
| Priority date | — |
| Expiry date | May 20, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G21/0035
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method to evaluate the cleaning performance of brush cleaners by measuring the brush to photoreceptor nip width (e.g cleaning footprint or contact zone) using an ESV sensor or ETAC sensor. This nip width measurement is automatically made using one of the sensing devices. The nip width measurement is converted into diagnostic information using a software algorithm or similar mode of conversion. The diagnostic information can be used in a variety of ways such as a diagnostic tool for a technical representative to warn against the end of brush life, to adjust cleaner biases for automatic changes in setup to achieve better cleaning, to predict brush replacement, to correct brush BPI (i.e. brush to photoreceptor interference) for an under or over engaged brush.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.