Patent · US Expired

Mass resolution in time-of-flight mass spectrometers with reflectors

US5654545A · kind A · utility

70Cited by

5References

14Claims

0Family size

Assignee

Bruker-Franzen Analytik GmbH · DE

Inventors

Armin Holle · Oyten, DE
Claus Koster · Lilienthal, DE
Jochen Franzen · Bremen, DE

Key dates

Filing date	Apr 4, 1996
Grant date	Aug 5, 1997
Priority date	—
Expiry date	Apr 4, 2016

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/403
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

A method for the high resolution analysis of analyte ions in a time-of-flight mass spectrometer. The method consists of the generation of an intermediate time-focus plane for ions of a certain mass at a location between an ion source and an ion reflector, and then using the ion reflector to temporally focus the ions of equal mass and differing velocities which pass this plane at the same time onto a detector. For time-of-flight mass spectrometers with an ion selector, the ion selector is particularly favorable location for this intermediate plane with time focus; and with a collision cell for the collision fragmentation of the ions, the collision cell is a particularly favorable location.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.