Method and apparatus for real time defect inspection of metal at elevated temperature
US5654977A · kind A · utility
38Cited by
7References
62Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 2, 1995 |
| Grant date | Aug 5, 1997 |
| Priority date | — |
| Expiry date | Feb 2, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/2045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for detecting, in real time, the existence, depth, extent, and type of a defect in an above ambient temperature object which has been formed by working or other heat input. Such defect detection is performed by analyzing IR emissions from the product, and from a defect site in particular, in order to assess the characteristics of the detected defect. The defect observables are then compared with known defect training data in order to characterize the defect as to type, depth and extent.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.