Patent · US Expired

Technique for achieving preferred optical alignment in a scanning interferometer

US5657122A · kind A · utility

10Cited by
2References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 1995
Grant dateAug 12, 1997
Priority date
Expiry dateJun 6, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2003/2866
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Alignment circuity and calibration method for a scanning interferometer. Phase shifts are introduced into the alignment servo to maximize overall modulation efficiency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.