Method and apparatus for assessing the quality of a seed lot
US5659623A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 17, 1995 |
| Grant date | Aug 19, 1997 |
| Priority date | — |
| Expiry date | Mar 17, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30128
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for assessing the quality of a seed lot utilizes image analysis equipment to generate an indication of seed quality. In one method, the quality of the seed lot may be determined by generating an image of a plurality of seedlings grown from a plurality of seeds selected from the seed lot, determining the leaf surface area of each of the seedlings from the image, determining the total leaf surface area of the seedlings from the image, determining a surface area threshold relating to the leaf surface areas of a plurality of the seedlings, determining the proportion of the seedlings which have a leaf surface area that exceeds the surface area threshold, and generating an indication of seed quality based upon that proportion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.