FDIC method for minimizing measuring failures in a measuring system comprising redundant sensors
US5661735A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 26, 1995 |
| Grant date | Aug 26, 1997 |
| Priority date | — |
| Expiry date | Dec 26, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D3/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for minimizing measured quantities determined from sensors affected by measuring failures and detected by a plurality of redundant sensors connected to form a measuring system by detecting and isolating the sensors affected by failures. Sensor values measured by all the sensors are mapped by a linear transformation into a vector in the parity space (parity vector). The dimension of the parity space is determined by the redundance of the measuring system (i.e., the number of sensors and the dimension of the quantity to be measured). The subspaces at each failure level that contain the largest proportion of the measured parity vector are determined by projection of the measured parity vector onto all possible subspaces. The best sensor combination at each failure level can be determined by omitting the sensor combinations belonging to such subspaces.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.