Patent · US Expired

Method of fabricating a semiconductor device having an insulating side wall

US5663097A · kind A · utility

9Cited by
15References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 1994
Grant dateSep 2, 1997
Priority date
Expiry dateSep 28, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of fabricating semiconductor devices comprises the following process of: forming an electrode leading out window having its vertical side wall at a given position in the functional element formed on a semiconductor substrate; forming an insulating film on the surface of the side wall; and depositing an electrode metal in the leading out window.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.