Method for measuring current distribution in an integrated circuit by detecting magneto-optic polarization rotation in an adjacent magneto-optic film
US5663652A · kind A · utility
8Cited by
5References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 7, 1995 |
| Grant date | Sep 2, 1997 |
| Priority date | — |
| Expiry date | Jun 7, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/855
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for measuring the current distribution in an integrated circuit with high time resolution is described incorporating a magneto-optic film, a linearly polarized light beam and a means for measuring the magneto-optic polarization rotation of a light beam and circuitry for synchronizing test pulses in an integrated circuit. The invention overcomes the problem of determining current distribution as a function of time and location in an integrated circuit with 1 psec time resolution and 1 micrometer spatial resolution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.