System and method for scan control of a programmable fuse circuit in an integrated circuit
US5668818A · kind A · utility
20Cited by
1References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 6, 1996 |
| Grant date | Sep 16, 1997 |
| Priority date | — |
| Expiry date | Aug 6, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/32
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A scan controllable, programmable fuse circuit is provided to enable testing of an integrated circuit in its final configuration before blowing any of the fuses of the programmable fuse circuits. This is achieved by incorporating a scannable latch that is connected to the output of a programmable fuse circuit and is configured for loading the output value of the programmable fuse circuit. The output value is then latched to the output of the scannable latch. Alternatively, a programmed output value can be scanned into the scannable latch and then latched to the output of the scannable latch.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.