Semiconductor device and method for fabricating the same
US5670800A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 1995 |
| Grant date | Sep 23, 1997 |
| Priority date | — |
| Expiry date | Jun 14, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10H20/824
Abstract
A semiconductor device includes a layer 16 of intermetallic compound layer 16 formed on a base substrate 10. The intermetallic compound is a ternary intermetallic compound 16 mixing a set amount of In with one of CoGa, NiGa, FeGa, CoAl, NiAl and FeAl . Twice of a lattice constant of the ternary intermetallic compound 16 is substantially equal to a lattice constant of a compound semiconductor forming the base substrate 10. Accordingly, the layer 16 of the intermetallic compound free from misfit dislocations can be formed on the semiconductor substrate or the semiconductor layer, and semiconductor elements can be formed on the wiring layer of the intermetallic compound layer 16.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.