Method for programming permanent calibration information at final test without increasing pin count
US5671183A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 1994 |
| Grant date | Sep 23, 1997 |
| Priority date | — |
| Expiry date | Dec 29, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31702
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A System and method for calibrating a chip after packaging including providing a packaged chip, providing programmable non-volatile storage having a plurality of non-volatile storage elements in the chip and providing a volatile storage having a plurality of volatile storage elements in the chip with one volatile storage element associated with one non-volatile storage element. The chip includes circuitry responsive to a predetermined signal to permit the non-volatile storage to be programmed in accordance with data stored in the volatile storage and to a predetermined signal to prevent external alteration of the non-volatile storage. The non-volatile storage is preferably a plurality of fuses. The volatile storage is preferably a shift register. The circuitry in the chip includes a bistable device responsive to the predetermined signal to assume a first condition to permit the non-volatile storage to be programmed and responsive to the alteration of the predetermined signal to assume a second condition which does not allow alteration of data. The system further includes a non-volatile storage element settable to one of a first or a second condition and preset to the first conditio…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.