Patent · US Expired

Semiconductor fuse and method

US5672905A · kind A · utility

19Cited by
14References
8Claims
0Family size

Assignees

Inventors

Key dates

Filing dateAug 26, 1992
Grant dateSep 30, 1997
Priority date
Expiry dateAug 26, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor fuse and method for fabricating the same An insulating layer is provided and a trench formed therein. A fusible link is then formed across the insulating layer and trench and conformal therewith. The link has a break region of minimum thickness and width at an intersection of a sidewall and bottom surface of the trench.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.