Scan test circuit using fast transmission gate switch
US5673277A · kind A · utility
11Cited by
40References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 17, 1996 |
| Grant date | Sep 30, 1997 |
| Priority date | — |
| Expiry date | Oct 17, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318541
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A fast transmission, integrated circuit switching device responsive to at least one external on/off control signal, and including a first input/output node, and a second input/output node, the switching device operative to pass or block the bidirectional transmission of external data signals between the first node and the second node, the switching device comprising a bidirectional field-effect transistor; a first scan cell; and a second scan cell; whereby input and output data signals of the switching device may be sensed and stored.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.