Patent · US Expired

Acoustic microscope

US5675075A · kind A · utility

14Cited by
6References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 1995
Grant dateOct 7, 1997
Priority date
Expiry dateNov 13, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/87
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An acoustic microscope allowing both the topography and the elasticity of a sample to be measured at the same time. To this end the displacement of a cantilever with a tip is measured by the deflection of a laser beam. In order to measure the topography, the average deviation of the tip is held constant by a regulation circuit. The regulation circuit consists of a split-photodiode which supplies a neutral signal to the output of a normalizing amplifier which delivers a neutral value. Deviations from this neutral signal are compensated by a z-electrode of a piezocrystal. The elastic properties of the sample are measured by coupling ultrasound into the sample by means of a transducer and the high-frequency displacements of the cantilever with the tip are detected by a second detection device that consists of knife-edge detector and a fast photodiode. The detection device may also consist of a heterodyne time-of-flight interferometer or a capacitive detection scheme.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.