Patent · US Expired

Method of fabricating a field emission device

US5675210A · kind A · utility

12Cited by
1References
28Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 31, 1995
Grant dateOct 7, 1997
Priority date
Expiry dateJul 31, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J1/3042
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of fabricating a field emission device which can facilitate the formation of a micro-tip for emitting electrons by a field effect. The micro-tip is fabricated such that the etching rate differences among the tungsten cathode, the lower titanium adhesive layer and the upper aluminum mask, and the internal stress differences are made to be very large, and thus, tungsten micro-tip is protruded by the internal stress when the adhesive layer and the mask are instantaneously etched. Since the micro-tip size is easily adjusted, and the internal stress of tungsten and characteristics of BOE method are utilized throughout the fabricating process, the reproducibility is ensured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.