Apparatus for stress testing capacitive components
US5677634A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 1995 |
| Grant date | Oct 14, 1997 |
| Priority date | — |
| Expiry date | Nov 16, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/64
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A plurality of electrical circuit components having capacitance, e.g. ceramic capacitors, are tested simultaneously in a corresponding plurality of test channels. They are stressed by a variable voltage source that can produce an electrical potential selected from a wide range from low potential to high potential. For example the range of selectable potentials can be 1000 volts with a resolution of 1 volt. The charge current by which a component accumulates a charge is controlled to a selected linear rate by a current controller. Voltage sensors and current sensors measure accumulated charges and leakage current, respectively. The current sensor can be selectively sensitized to a plurality of anticipated leakage current ranges. In addition, the selected potentials can each be applied to the components in a single step or can be applied over time in ramp fashion. A processor can be used for running at least a prescribed test process on components, the processor being operatively coupled to, for controlling and receiving inputs from, the above elements. For example the processor is preferably coupled to the variable voltage source, the current controller, the voltage sensor, the curr…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.