Bent probe microscopy
US5677978A · kind A · utility
18Cited by
8References
10Claims
0Family size
Inventors
Key dates
| Filing date | Feb 7, 1996 |
| Grant date | Oct 14, 1997 |
| Priority date | — |
| Expiry date | Feb 7, 2016 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/881
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A general purpose force sensor for measuring nanometer scale surface topography and other characteristics includes a hollow micropipette having an inner diameter of about 7.5 nanometers at its tip. The probe includes a cantilevered structure obtained by heating it near the tip to bend it. A reflective coating is then applied to the outer surface of the micropipette.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.