Vision inspection system and method
US5680215A · kind A · utility
41Cited by
13References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 27, 1995 |
| Grant date | Oct 21, 1997 |
| Priority date | — |
| Expiry date | Feb 27, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8472
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical vision inspection system (4) and method for multiplexed illuminating, viewing, analyzing and recording a range of characteristically different kinds of defects, depressions, and ridges in a selected material surface (7) with first and second alternating optical subsystems (20, 21) illuminating and sensing successive frames of the same material surface patch. To detect the different kinds of surface features including abrupt as well as gradual surface variations, correspondingly different kinds of lighting are applied in time-multiplexed fashion to the common surface area patches under observation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.