Patent · US Expired

Method and apparatus for detecting and identifying faulty sensors in a process

US5680409A · kind A · utility

212Cited by
16References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 11, 1995
Grant dateOct 21, 1997
Priority date
Expiry dateAug 11, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D3/08
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus is provided for detecting a faulty sensor within a process control system having a set of sensors, each of which produces an associated sensor output signal. The method and apparatus produce a set of sensor estimate signals from the sensor output signals using principal component analysis and then determine a validity index for each of the sensors as a ratio of two residuals, wherein each of the residuals represents a different measure of the difference between the sensor output signals and the sensor estimate signals. The determined validity indexes are then used to detect a failure of one of the sensors and/or to identify which one of the sensors has failed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.