Patent · US Expired

Method and apparatus for ultrasonic inspection of electronic components

US5684252A · kind A · utility

35Cited by
7References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 1996
Grant dateNov 4, 1997
Priority date
Expiry dateJul 15, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/2698
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for non-destructive ultrasonic inspection in which a plurality of integrated circuits or other electronic components laid out in a fixed pattern on a liquid-permeable tray are moved along an inspection path through a scanning station. In the scanning station the electronic components are repetitively scanned by an ultrasonic beam from a transmitter/receiver moving rapidly back and forth across the inspection path; an ultrasonic coupling liquid (usually water) continuously flows along the beam path; the coupling liquid also flows along the surfaces of the electronic components opposite the beam path. The tray of electronic components is air dried as it emerges from the scanning station. Both reflected and "through" ultrasonic signals can be collected to disclose any anomalies present in the electronic components. A screen may be used to assure retention of the electronic components in the desired pattern on a tray.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.