Patent · US Expired

Device data acquisition

US5687098A · kind A · utility

58Cited by
29References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 1995
Grant dateNov 11, 1997
Priority date
Expiry dateOct 30, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T137/7761
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Data samples are obtained from a control device while in use to control a material process. Selected ones of these samples are stored which represent results of operating the device over portions of its characteristics, and they are selectively combined to provide an indication of the complete device characteristics. Selected such data samples are used provide information concerning selected control device parameters based on the device characteristics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.