Method and device for determining the attenuation function of an object with respect to the transmission of a reference material thickness
US5687210A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 5, 1996 |
| Grant date | Nov 11, 1997 |
| Priority date | — |
| Expiry date | Sep 5, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The object's transmission function is expressed as a finite power expansion of a reference-material reference thickness, each expansion power being equal to a ratio of a reference-material thickness to the reference thickness; the expansion coefficients are determined from the measurements of the intensities transmitted by the selected various thicknesses, including zero thickness, of the reference material exposed to a test beam evincing consecutively several energy spectra and from the measurements of the intensity transmitted by the object exposed to this same variable-spectrum test beam; the attenuation function is derived from the determination of the transmission function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.