Temperature-compensated, self-calibrating, contact-type gaging system and method for calibrating the same
US5689447A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 1, 1995 |
| Grant date | Nov 18, 1997 |
| Priority date | — |
| Expiry date | Dec 1, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature-compensated, self-calibrating, contact-type gaging system and method for calibrating the same. The system is configured to run in a calibration mode and a measurement mode. During the calibration mode, a unique temperature profile is generated for each particular system. The temperature offset includes offset values calculated to compensate for gaging system hardware errors as well as other measurement error caused by temperature variations encountered during gaging applications. In the measurement mode, part size measurements are adjusted by the offsets contained in the temperature profile generated for the gaging system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.