Patent · US Expired

Jitter measuring method and apparatus

US5692009A · kind A · utility

10Cited by
1References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 30, 1994
Grant dateNov 25, 1997
Priority date
Expiry dateSep 30, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L1/205
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

A jitter measuring method and apparatus is provided which is capable of measuring jitters in serial digital signals transmitted at a high bit rate. The method and apparatus detects from a serial digital signal frequency deviations of a predetermined frequency corresponding to a predetermined period. The detected frequency deviations are converted to period deviations of the predetermined period.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.