Laser beam analyzer
US5694209A · kind A · utility
8Cited by
6References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 21, 1995 |
| Grant date | Dec 2, 1997 |
| Priority date | — |
| Expiry date | Sep 21, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J1/4257
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for sampling a section of a laser beam using an elongated reflective element that is moved in a main direction that corresponds to the direction of elongation of the element and in a direction perpendicular to the main direction. This sampling device forms a part of a laser beam analyzer and provides a small reflected beam segment to the analyzer that corresponding to the part of the laser beam that impinges upon the moving elongated reflecting element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.