Patent · US Expired

Method and apparatus for preventing overdrive of a semiconductor circuit

US5696467A · kind A · utility

7Cited by
1References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 23, 1996
Grant dateDec 9, 1997
Priority date
Expiry dateFeb 23, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03F1/52
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for unambiguous, precise and self-calibrating detection of unreliable semiconductor operation is provided. The apparatus includes an optically coupled sensor positioned over a semiconductor device and an electrical feedback control loop for adjusting the operating range of the semiconductor device. The method includes the steps of measuring optical emissions from a semiconductor device and adjusting compensation circuitry connected to the semiconductor device in response to the measured emissions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.