Patent · US Expired

Method and apparatus for non-contact temperature measurement

US5696703A · kind A · utility

4Cited by
8References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 23, 1995
Grant dateDec 9, 1997
Priority date
Expiry dateMay 23, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J5/602
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of monitoring the temperature of a target (4), the method comprising: PA1 a) sensing radiation emitted by the target (4) at at least two different wavelengths; PA1 b) determining a temperature value from the sensed radiation in accordance with a first predetermined algorithm; PA1 c) repeating steps a) and b) a number of times to generate a set of temperature values; PA1 d) selecting a target temperature from the set of temperature values in accordance with a second predetermined algorithm; and, PA1 e) generating an output signal defining the target temperature obtained in step d).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.