Patent · US Expired

Nonvolatile semiconductor memory device

US5698879A · kind A · utility

59Cited by
1References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 18, 1995
Grant dateDec 16, 1997
Priority date
Expiry dateAug 18, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00

Abstract

A nonvolatile semiconductor memory device has reduced parasitic capacitance at a select transistor obtained by providing a depletion-mode select transistor with a charge accumulation layer, virtually making a gate insulating film thicker, or providing under the gate insulating film a channel layer that is of a same conductivity type as that of a source and drain regions and connects thereto, thereby enabling the potential of the select gate to be almost fixed at a desired value, preventing a faulty operation and making it possible to cause the select transistor to operate at high speed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.