Method to estimate a corrected response of a measurement apparatus relative to a set of known responses and observed measurements
US5699246A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 22, 1995 |
| Grant date | Dec 16, 1997 |
| Priority date | — |
| Expiry date | Sep 22, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a new method to determine corrected characteristics of materials using the measured quantities obtained by a measurement and an extensive set of database points representing laboratory and modeled results in well defined environments. In particular the invention relates to the measurement of the characteristics of the formation around a wellbore as well as of the borehole with a well logging tool. Using a dynamic parametrization technique, the environmental corrections and the transformations from the measured to the physical characteristics can be achieved in a more accurate, robust and flexible way. The dynamic local parametrization is based on a weighted multiple linear regression over the entire database to obtain the local coefficients for the transformation which can be expressed as a simple equation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.