Patent · US Expired

Appliance for measuring polarization mode dispersion and corresponding measuring process

US5712704A · kind A · utility

41Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 13, 1996
Grant dateJan 27, 1998
Priority date
Expiry dateSep 13, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/105
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An appliance for measuring polarization mode dispersion (PMD) of a waveguide (2) comprises a source (1, 6) of wide-band polarized light, an interferometer (5) capable of receiving a light beam (21) sent by the source (1, 6), a detector (3) capable of detecting the light beam (25) from the interferometer (5), and an electronic processing unit (4) connected to the detector (3), capable of extracting a value .tau. representative of the polarization mode dispersion of the waveguide (2). The interferometer (5) divides a measuring light beam (22) sent by the source (1) into two interference light beams (23, 24). The measuring appliance comprises at least one birefringent element (17) positioned on the interferometer (5), capable of producing an algebraic difference of relative phase shifts in each of the two interference light beams (23, 24) equal to .pi..

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.