Apparatus for testing and measuring electronic device and method of calibrating its timing and voltage level
US5712855A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 29, 1993 |
| Grant date | Jan 27, 1998 |
| Priority date | — |
| Expiry date | Oct 29, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3191
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is intended to provide a testing and measuring apparatus for accurately and quickly calibrating the input and output timing of a plurality of test signal patterns and voltage levels. The invention also offers a method used for the calibration. The apparatus is equipped with a plurality of units (timing vector generators) each having a timing-generating circuit (a capture timing generator) and an external common reference timing circuit (a golden edge generator) outside the units. Each unit comprises: (1) a timing comparator circuit (a capture comparator) for comparing the timing each of the timing-generating circuits with the timing of the reference timing circuit to determine whether the former timing leads or lags the latter timing; and (2) a counter circuit which counts a number of comparisons made by the comparator circuit until their sequential relation has been reversed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.