Patent · US Expired

Process for the manufacture of thin films of semiconductor material

US5714395A · kind A · utility

426Cited by
9References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 12, 1996
Grant dateFeb 3, 1998
Priority date
Expiry dateSep 12, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/977
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The process includes the following steps: implantation of ions (12) in a semi-conducting wafer (10), to create a cleavage layer of gaseous microblisters (16) in the wafer, heat treatment of the wafer, in order to cause separation of a surface layer (18) from the rest of the wafer, along the layer of microblisters. According to the invention, the implantation is carried out at a depth equal to or greater than a given minimum depth so that the thin film obtained is rigid, and so that the heat treatment can release it.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.