Patent · US Expired

Method and apparatus for optical alignment of a measuring head in an X-Y plane

US5714763A · kind A · utility

18Cited by
1References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 1996
Grant dateFeb 3, 1998
Priority date
Expiry dateMar 25, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01G9/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A two-dimensional position detector, in combination with dynamic z and/or flutter sensors, provides dynamic misalignment detection and correction of a measuring head, thereby allowing accurate determinations to be made of properties of a sheet material, such as basis weight.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.