Patent · US Expired

Cytological system illumination integrity checking apparatus and method

US5715326A · kind A · utility

10Cited by
9References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 8, 1994
Grant dateFeb 3, 1998
Priority date
Expiry dateSep 8, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V20/69
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for checking cytological system illumination including the steps of checking global illumination variation, static field uniformity, dynamic field uniformity, specimen thickness variation, strobe repeatability, calibration plate cleanliness, and strobe dropout. A calibration plate and test target is employed for various illumination checks.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.