Patent · US Expired

Gas analyzer with arrangement for spray-cleaning optical element

US5720650A · kind A · utility

10Cited by
12References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 13, 1997
Grant dateFeb 24, 1998
Priority date
Expiry dateFeb 13, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/0029
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A gas analysis apparatus for analysis of sample gas wherein the apparatus has a mechanism for cleaning optical elements such as reflectors and windows in the apparatus is provided. The gas analysis apparatus includes a light source for emitting light, a body having an isolated cavity in which the light emitted by the light source propagates, a detector for analyzing light scattered by the sample gas in the isolated cavity, and a spraying system connected to the body to spray a sublimable substance. The isolated cavity has one or more optical elements each with a surface. The spray of the sublimable substance is directed onto such a surface for in situ removal of contaminants. The body has a sample inlet port for introducing the sample gas into the cavity and an outlet port for venting gas from the cavity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.