Method and apparatus for testing integrated magnetic head assembly
US5721488A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 30, 1996 |
| Grant date | Feb 24, 1998 |
| Priority date | — |
| Expiry date | May 30, 2016 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49004
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for testing an integrated magnetic head assembly for normal operation. The head assembly includes an inductive write element and a MR read element. The method includes a step of applying an external alternating magnetic field to a plurality of magnetic head assemblies which are aligned on a head block and are not yet individually separated from the head block, in a direction perpendicular to an ABS of the head block, and also applying high frequency current to the inductive write element so that alternating leakage magnetic field from the inductive write element is applied to the MR read element, and a step of measuring varying resistance characteristics of the MR read element with respect to the variation of the external alternating magnetic field and to the variation of the alternating leakage magnetic field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.