Sensor system for measurement of temperature or strain
US5721615A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 25, 1996 |
| Grant date | Feb 24, 1998 |
| Priority date | — |
| Expiry date | Jan 25, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sensor system in an interferometric arrangement has a sensor arm and a reference arm. The reference arm is in a stable environment and the sensor arm is arranged to be subject to variations in strain and/or temperature. Radiation from a broadband source propagates through the arrangement and a broadband interferogram is generated as an air gap is scanned. The interferogram is recorded on an oscilloscope and analyzed using signal processing software on a computer. From the analysis the changes in group delay and optical dispersion of the light in the sensor arm due to strain and temperature changes is measured, and values for the strain and/or temperature changes calculated. A narrowband light source may be used for accurate calibration of path length differences during scanning. The strain and temperature on the sensor arm may be calibrated or tested using clamps and a thermal enclosure. The system may also be configured in a tandem interferometry arrangement including a sensing interferometer and reference interferometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.