Patent · US Expired

Dry etching method, method of fabricating semiconductor device, and method of fabricating liquid crystal display device

US5723366A · kind A · utility

37Cited by
1References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 1995
Grant dateMar 3, 1998
Priority date
Expiry dateSep 28, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02F1/13439
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A dry etching method includes the steps of etching a transparent electrode film by reactive ion etching with a first etching gas, changing the first etching gas to a second etching gas, and etching the transparent electrode film by reactive ion etching with the second etching gas. A chlorine containing gas is employed as the second etching gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.