Chip damage detecting circuit for semiconductor IC
US5723875A · kind A · utility
19Cited by
4References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 23, 1996 |
| Grant date | Mar 3, 1998 |
| Priority date | — |
| Expiry date | Oct 23, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/3011
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor integrated circuit has a chip check circuit for detecting cracks and other defects in the chip during operation. The chip check circuit extends in the chip from an input terminal to an output terminal so as to scan a predetermined wide area. The chip check circuit has at least one signal line extending near or within a circuit block in the chip so that the signal line can be broken together with the circuit block. The chip check circuit may further comprise one or more inverters, and/or one or more two-wire logic circuits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.