Rosette-type optical microsystem of strain gauges having dielectric guides for measuring a longitudinal strain in a planar structure
US5726744A · kind A · utility
33Cited by
3References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 30, 1995 |
| Grant date | Mar 10, 1998 |
| Priority date | — |
| Expiry date | Oct 30, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L1/246
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a planar, rosette-type, optical microsystem with strain gauges having dielectric guides used for measuring a system of strains or stresses applied to a part, in which the part is under purely longitudinal strain, at least one rosette being formed by at least two strain gauges with dielectric guides (J1, J2, J3) and in which a calculating circuit makes it possible to determine said strain by resolving a system of equations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.