Patent · US Expired

Probe, device and method for testing eggs

US5728939A · kind A · utility

6Cited by
1References
23Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 15, 1996
Grant dateMar 17, 1998
Priority date
Expiry dateApr 15, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/02854
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe for an egg-testing device includes a probe tube with an annular magnet disposed at a bottom end thereof. In the probe tube, a spherical excitation member is magnetically retained by the annular magnet. The probe is axially movable in a metal tube around which a bobbin is wound. In a rest position, the probe is retained by the magnetic attractive force between the metal tube and the annular magnet. The probe is brought into an operating position by an excitation pulse supplied to the bobbin, which pulse is provided by a control unit, taking into account the diameter of an egg to be tested and the conveying speed of a conveyor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.