Method of testing a cache tag memory array
US5729677A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 1995 |
| Grant date | Mar 17, 1998 |
| Priority date | — |
| Expiry date | Jul 31, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F12/0895
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Content testing (302-306) and comparator testing (312-326) of a tag section (24, 26) of a cache tag memory array is performed to confirm that the tag section (24, 26) is functional. For content testing (302-306), each tag location is tested once. Comparator testing (312-326) is performed to determine the functionality of the comparator (240, 260) of the cache tag memory array. The number of tests performed for the comparator testing is 2.times.M+2, where M is the number of bit positions in the tag location. Two of the tests are for testing the comparator's ability to identify correctly hits within the tag section (312-316). The other tests are for testing the comparator's ability to identify correctly misses within the tag section at each bit position of the tag locations (322-326).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.