Method of determining the transferred layer mass during thermal spraying methods
US5731030A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 20, 1996 |
| Grant date | Mar 24, 1998 |
| Priority date | — |
| Expiry date | Sep 20, 2016 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB05B7/201
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
A method of monitoring and controlling thermal spraying methods for coating the surface of substrates. During the spraying process, a substrate surface temperature is measured as a characteristic variable for the transferred layer mass or layer thickness, and, in the event of deviations from the nominal value, at least one method parameter that is significant for the transferred layer mass or layer thickness is changed. The method permits the creation of layers having a predetermined transferred layer mass or layer thickness and a narrow layer thickness distribution over the coated surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.