Enhancement of measurement accuracy in bulk material analyzer
US5732115A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 20, 1995 |
| Grant date | Mar 24, 1998 |
| Priority date | — |
| Expiry date | Jun 20, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a bulk material analyzer in which bulk material is received in an activation region between a pair of neutron sources laterally disposed on one side of the activation region for emitting neutrons for bombarding the bulk material within the activation region to cause gamma-rays to be emitted from the bombarded bulk material and a pair of gamma-ray detectors laterally disposed on another side of the activation region for detecting gamma-rays emitted from the bulk material, a primary neutron moderator is disposed about the neutron sources for reducing the velocity of the emitted neutrons; and a secondary neutron moderator is disposed about the primary neutron moderator for further reducing the velocity of the neutrons and is further disposed adjacent the lateral edges of the activation region for channeling and reflecting the neutrons into the activation region. The two gamma-ray detectors are disposed toward opposite lateral edges of the activation region, with each detector being skewed so that a portion of each detector that is closer to the edge of the activation region toward which the detector is disposed than to the lateral center of the activation region is disposed closer …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.