Method of automatic exposure control in a MOS imaging array
US5734426A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 15, 1996 |
| Grant date | Mar 31, 1998 |
| Priority date | — |
| Expiry date | Nov 15, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/71
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In a MOS imaging array, it is important to control the exposure time of the array to incident light. For varying changes in ambient light, the exposure time of the array must be changed. The present invention describes a method for controlling the exposure time of the imaging array. Each of the intensities of the pixels in a frame are analyzed to provide an indication of the number of pixels having an intensity above and below predetermined thresholds, NW and NB, respectively. If NW is above a predetermined threshold, KW, then an adjustment in the exposure time may be made. If not, then no adjustment is made.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.