Patent · US Expired

Nonlinear ultrasonic scanning to detect material defects

US5736642A · kind A · utility

41Cited by
13References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 8, 1997
Grant dateApr 7, 1998
Priority date
Expiry dateJan 8, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/104
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system are provided to detect defects in a material. Waves of known frequency(ies) are mixed at an interaction zone in the material. As a result, at least one of a difference wave and a sum wave are generated in the interaction zone. The difference wave occurs at a difference frequency and the sum wave occurs at a sum frequency. The amplitude of at least one nonlinear signal based on the sum and/or difference waves is then measured. The nonlinear signal is defined as the amplitude of one of the difference wave and sum wave relative to the product of the amplitude of the surface waves. The amplitude of the nonlinear signal is an indication of defects (e.g., dislocation dipole density) in the interaction zone.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.